Atomic force microscopy of titanium oxide nanosize structures resistive switching
Электронный научный архив УРФУ
Информация об архиве | Просмотр оригинала| Поле | Значение | |
| Заглавие |
Atomic force microscopy of titanium oxide nanosize structures resistive switching
|
|
| Автор |
Avilov, V. I.
Smirnov, V. A. Tominov, R. V. Sharapov, N. A. Avakyan, A. A. |
|
| Описание |
This work was supported by RFBR according to the research project № 18-37-00299 and by Grant of the President of the Russian Federation No. MK-2721.2018.8.
|
|
| Дата |
2019-12-19T12:26:01Z
2019-12-19T12:26:01Z 2019 |
|
| Тип |
Conference Paper
Conference object (info:eu-repo/semantics/conferenceObject) Published version (info:eu-repo/semantics/publishedVersion) |
|
| Идентификатор |
Atomic force microscopy of titanium oxide nanosize structures resistive switching / V. I. Avilov, V. A. Smirnov, R. V. Tominov, N. A. Sharapov, A. A. Avakyan // Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. Abstract Book of Joint International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2019. — P. 131-132.
978-5-9500624-2-1 http://elar.urfu.ru/handle/10995/79013 |
|
| Язык |
en
|
|
| Связанные ресурсы |
Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. — Ekaterinburg, 2019
|
|
| Формат |
application/pdf
|
|
| Издатель |
Ural Federal University
|
|