Conductive Atomic Force Microscopy study of local resistive switching by a complex signal in the yttria stabilized zirconia films
Электронный научный архив УРФУ
Информация об архиве | Просмотр оригинала| Поле | Значение | |
| Заглавие |
Conductive Atomic Force Microscopy study of local resistive switching by a complex signal in the yttria stabilized zirconia films
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| Автор |
Filatov, D. O.
Koryazhkina, M. N. Antonov, D. A. Antonov, I. N. Liskin, D. A. Ryabova, M. A. Gorshkov, O. N. |
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| Описание |
This work was supported by RFBR (18-42-520059р_а).
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| Дата |
2019-12-19T12:26:06Z
2019-12-19T12:26:06Z 2019 |
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| Тип |
Conference Paper
Conference object (info:eu-repo/semantics/conferenceObject) Published version (info:eu-repo/semantics/publishedVersion) |
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| Идентификатор |
Conductive Atomic Force Microscopy study of local resistive switching by a complex signal in the yttria stabilized zirconia films / D. O. Filatov, M. N. Koryazhkina, D. A. Antonov, I. N. Antonov, D. A. Liskin, M. A. Ryabova, O. N. Gorshkov // Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. Abstract Book of Joint International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2019. — P. 177-178.
978-5-9500624-2-1 http://elar.urfu.ru/handle/10995/79054 |
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| Язык |
en
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| Связанные ресурсы |
Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. — Ekaterinburg, 2019
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| Формат |
application/pdf
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| Издатель |
Ural Federal University
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