Raman scattering study of SrTiO3: Bi ceramics with higher (x = 0.16) bismuth content
Электронный научный архив УРФУ
Информация об архиве | Просмотр оригинала| Поле | Значение | |
| Заглавие |
Raman scattering study of SrTiO3: Bi ceramics with higher (x = 0.16) bismuth content
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| Автор |
Krylova, S. N.
Vtyurin, A. N. Krylov, A. S. Wei, X. Chen, W. |
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| Дата |
2019-12-19T12:26:07Z
2019-12-19T12:26:07Z 2019 |
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| Тип |
Conference Paper
Conference object (info:eu-repo/semantics/conferenceObject) Published version (info:eu-repo/semantics/publishedVersion) |
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| Идентификатор |
Raman scattering study of SrTiO3: Bi ceramics with higher (x = 0.16) bismuth content / S. N. Krylova, A. N. Vtyurin, A. S. Krylov, X. Wei, W. Chen // Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. Abstract Book of Joint International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2019. — P. 188.
978-5-9500624-2-1 http://elar.urfu.ru/handle/10995/79064 |
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| Язык |
en
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| Связанные ресурсы |
Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. — Ekaterinburg, 2019
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| Формат |
application/pdf
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| Издатель |
Ural Federal University
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