Nano-layered-structure interface and Zinc diffusion of borosilicate glass during sealing process
Электронный научный архив УРФУ
Информация об архиве | Просмотр оригинала| Поле | Значение | |
| Заглавие |
Nano-layered-structure interface and Zinc diffusion of borosilicate glass during sealing process
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| Автор |
Li, S. H.
Hu, K. J. Wang, J. Liu, J. Y. Shen, X. Y. Zhang, Y. |
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| Дата |
2019-12-19T12:26:07Z
2019-12-19T12:26:07Z 2019 |
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| Тип |
Conference Paper
Conference object (info:eu-repo/semantics/conferenceObject) Published version (info:eu-repo/semantics/publishedVersion) |
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| Идентификатор |
Nano-layered-structure interface and Zinc diffusion of borosilicate glass during sealing process / S. H. Li, K. J. Hu, J. Wang, J. Y. Liu, X. Y. Shen, Y. Zhang // Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. Abstract Book of Joint International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2019. — P. 192.
978-5-9500624-2-1 http://elar.urfu.ru/handle/10995/79067 |
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| Язык |
en
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| Связанные ресурсы |
Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. — Ekaterinburg, 2019
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| Формат |
application/pdf
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| Издатель |
Ural Federal University
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