Study of inelastic electron tunneling in the Pt-Au tunnel junction in ultra-high vacuum STM
Электронный научный архив УРФУ
Информация об архиве | Просмотр оригиналаПоле | Значение | |
Заглавие |
Study of inelastic electron tunneling in the Pt-Au tunnel junction in ultra-high vacuum STM
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Автор |
Lebedev, D. V.
Mukhin, I. S. Shkoldin, V. A. Mozharov, A. M. Golubok, A. O. |
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Описание |
This work was carried out with the support of the Russian Science Foundation (Grant 17-19-01532).
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Дата |
2019-12-19T12:26:28Z
2019-12-19T12:26:28Z 2019 |
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Тип |
Conference Paper
Conference object (info:eu-repo/semantics/conferenceObject) Published version (info:eu-repo/semantics/publishedVersion) |
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Идентификатор |
Study of inelastic electron tunneling in the Pt-Au tunnel junction in ultra-high vacuum STM / D. V. Lebedev, I. S. Mukhin, V. A. Shkoldin, A. M. Mozharov, A. O. Golubok // Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. Abstract Book of Joint International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2019. — P. 108-109.
978-5-9500624-2-1 http://elar.urfu.ru/handle/10995/79234 |
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Язык |
en
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Связанные ресурсы |
info:eu-repo/grantAgreement/RSF//17-19-01532
Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. — Ekaterinburg, 2019 |
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Формат |
application/pdf
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Издатель |
Ural Federal University
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