Просмотреть запись

Study of inelastic electron tunneling in the Pt-Au tunnel junction in ultra-high vacuum STM

Электронный научный архив УРФУ

Информация об архиве | Просмотр оригинала
 
 
Поле Значение
 
Заглавие Study of inelastic electron tunneling in the Pt-Au tunnel junction in ultra-high vacuum STM
 
Автор Lebedev, D. V.
Mukhin, I. S.
Shkoldin, V. A.
Mozharov, A. M.
Golubok, A. O.
 
Описание This work was carried out with the support of the Russian Science Foundation (Grant 17-19-01532).
 
Дата 2019-12-19T12:26:28Z
2019-12-19T12:26:28Z
2019
 
Тип Conference Paper
Conference object (info:eu-repo/semantics/conferenceObject)
Published version (info:eu-repo/semantics/publishedVersion)
 
Идентификатор Study of inelastic electron tunneling in the Pt-Au tunnel junction in ultra-high vacuum STM / D. V. Lebedev, I. S. Mukhin, V. A. Shkoldin, A. M. Mozharov, A. O. Golubok // Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. Abstract Book of Joint International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2019. — P. 108-109.
978-5-9500624-2-1
http://elar.urfu.ru/handle/10995/79234
 
Язык en
 
Связанные ресурсы info:eu-repo/grantAgreement/RSF//17-19-01532
Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. — Ekaterinburg, 2019
 
Формат application/pdf
 
Издатель Ural Federal University