Exploring Charged Defects in Ferroelectrics by the Switching Spectroscopy Piezoresponse Force Microscopy
Электронный научный архив УРФУ
Информация об архиве | Просмотр оригинала| Поле | Значение | |
| Заглавие |
Exploring Charged Defects in Ferroelectrics by the Switching Spectroscopy Piezoresponse Force Microscopy
|
|
| Автор |
Alikin, D.
Abramov, A. Turygin, A. Ievlev, A. Pryakhina, V. Karpinsky, D. Hu, Q. Jin, L. Shur, V. Tselev, A. Kholkin, A. |
|
| Тематика |
BIAS FIELD
DOMAIN WALLS, HYSTERESIS LOOPS, POLARIZATION REVERSAL SCREENING VACANCIES DEFECTS FERROELECTRIC MATERIALS HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY NEUTRON DIFFRACTION SECONDARY ION MASS SPECTROMETRY SENSITIVITY ANALYSIS X RAY PHOTOELECTRON SPECTROSCOPY CHARGED DEFECTS DEFECT CONCENTRATIONS HIGH RESOLUTION LANTHANA DOPED NANO SCALE PIEZORESPONSE FORCE MICROSCOPY SAMPLE PREPARATION STRUCTURAL DEFECT STUDY METHODS X-RAY TOMOGRAPHY SCANNING PROBE MICROSCOPY |
|
| Описание |
Monitoring the charged defect concentration at the nanoscale is of critical importance for both the fundamental science and applications of ferroelectrics. However, up-to-date, high-resolution study methods for the investigation of structural defects, such as transmission electron microscopy, X-ray tomography, etc., are expensive and demand complicated sample preparation. With an example of the lanthanum-doped bismuth ferrite ceramics, a novel method is proposed based on the switching spectroscopy piezoresponse force microscopy (SSPFM) that allows probing the electric potential from buried subsurface charged defects in the ferroelectric materials with a nanometer-scale spatial resolution. When compared with the composition-sensitive methods, such as neutron diffraction, X-ray photoelectron spectroscopy, and local time-of-flight secondary ion mass spectrometry, the SSPFM sensitivity to the variation of the electric potential from the charged defects is shown to be equivalent to less than 0.3 at% of the defect concentration. Additionally, the possibility to locally evaluate dynamics of the polarization screening caused by the charged defects is demonstrated, which is of significant interest for further understanding defect-mediated processes in ferroelectrics. © 2021 Wiley-VCH GmbH
CICECO-Aveiro Institute of Materials U.S. Department of Energy, USDOE, (UIDB/50011/2020, UIDP/50011/2020) Office of Science, SC UT-Battelle, (DE-AC05-00OR22725) Fundação para a Ciência e a Tecnologia, FCT Ministerio de Educación, Cultura y Deporte, MECD Russian Science Foundation, RSF, (19‐72‐10076) European Regional Development Fund, ERDF Ural Federal University, UrFU Funding text 1: The reported study was funded by the Russian Science Foundation (grant 19-72-10076). The equipment of the Ural Center for Shared Use “Modern nanotechnology” Ural Federal University (Reg.№ 2968) was used. ToF-SIMS characterization was conducted at the Center for Nanophase Materials Sciences, which is a DOE Office of Science User Facility, and using instrumentation within ORNL's Materials Characterization Core provided by UT-Battelle, LLC under Contract No. DE-AC05-00OR22725 with the U.S. Department of Energy. PFM and XPS data analysis were performed in part by A.Ts. and was supported by the project CICECO-Aveiro Institute of Materials, UIDB/50011/2020 & UIDP/50011/2020, financed by national funds through the FCT/MEC and when appropriate co-financed by FEDER under the PT2020 Partnership Agreement. Funding text 2: The reported study was funded by the Russian Science Foundation (grant 19‐72‐10076). The equipment of the Ural Center for Shared Use “Modern nanotechnology” Ural Federal University (Reg.№ 2968) was used. ToF‐SIMS characterization was conducted at the Center for Nanophase Materials Sciences, which is a DOE Office of Science User Facility, and using instrumentation within ORNL's Materials Characterization Core provided by UT‐Battelle, LLC under Contract No. DE‐AC05‐00OR22725 with the U.S. Department of Energy. PFM and XPS data analysis were performed in part by A.Ts. and was supported by the project CICECO‐Aveiro Institute of Materials, UIDB/50011/2020 & UIDP/50011/2020, financed by national funds through the FCT/MEC and when appropriate co‐financed by FEDER under the PT2020 Partnership Agreement. |
|
| Дата |
2024-04-22T15:53:34Z
2024-04-22T15:53:34Z 2022 |
|
| Тип |
Article
Journal article (info:eu-repo/semantics/article) info:eu-repo/semantics/submittedVersion |
|
| Идентификатор |
Alikin, D, Abramov, A, Turygin, A, Ievlev, A, Pryakhina, V, Karpinsky, D, Hu, Q, Jin, L, Shur, V, Tselev, A & Kholkin, A 2022, 'Exploring Charged Defects in Ferroelectrics by the Switching Spectroscopy Piezoresponse Force Microscopy', Small Methods, Том. 6, № 2, 2101289. https://doi.org/10.1002/smtd.202101289
Alikin, D., Abramov, A., Turygin, A., Ievlev, A., Pryakhina, V., Karpinsky, D., Hu, Q., Jin, L., Shur, V., Tselev, A., & Kholkin, A. (2022). Exploring Charged Defects in Ferroelectrics by the Switching Spectroscopy Piezoresponse Force Microscopy. Small Methods, 6(2), [2101289]. https://doi.org/10.1002/smtd.202101289 2366-9608 Final All Open Access; Green Open Access https://ria.ua.pt/bitstream/10773/35964/1/Paper_SSPFM_Submitted_with_Suppl.pdf https://ria.ua.pt/bitstream/10773/35964/1/Paper_SSPFM_Submitted_with_Suppl.pdf http://elar.urfu.ru/handle/10995/132460 47551028 10.1002/smtd.202101289 85122073540 735904000001 |
|
| Язык |
en
|
|
| Права |
Open access (info:eu-repo/semantics/openAccess)
cc-by |
|
| Формат |
application/pdf
|
|
| Издатель |
John Wiley and Sons Inc
|
|
| Источник |
Small Methods
Small Methods |
|