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Comparison of the calculated and experimental dataof the extracted electron beam profile

Электронный архив ТПУ

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Поле Значение
 
Заглавие Comparison of the calculated and experimental dataof the extracted electron beam profile
 
Автор Miloichikova, Irina Alekseevna
Povolna, A.
Stuchebrov, Sergey Gennadevich
Naumenko, Gennadiy Andreevich
 
Тематика расчетные данные
экспериментальные данные
электронные пучки
ускорители
профили
электроны
микротроны
моделирование
 
Описание The current commercial use of electron accelerators grows in research, industry,medical diagnosis and treatment. Due to this fact, the creation of a model describing theelectron beam profile and shape is an actual task. The model of the TPU microtron extractedelectron beam created in the program "Computer Laboratory (PCLab)" is described andcompared with experimental results in this article. The value of the internal electron beamdivergence determination is illustrated. The experimental data of the electron beam profilesat the selected distances from the output window are analysed and compared with thesimulation data. The simulation data of the electron beam profiles are shown.
 
Дата 2016-04-12T23:41:49Z
2016-04-12T23:41:49Z
2015
 
Тип Conference Paper
Published version (info:eu-repo/semantics/publishedVersion)
Conference paper (info:eu-repo/semantics/conferencePaper)
 
Идентификатор Comparison of the calculated and experimental dataof the extracted electron beam profile / I. A. Miloichikova [et al.] // IOP Conference Series: Materials Science and Engineering. — 2015. — Vol. 93: Modern Technique and Technologies (MTT'2015) : 21th International Conference for Students and Young Scientists, 5-9 October 2015, Tomsk : [proceedings]. — [012067, 4 p.].
http://earchive.tpu.ru/handle/11683/20080
10.1088/1757-899X/93/1/012067
 
Язык en
 
Связанные ресурсы IOP Conference Series: Materials Science and Engineering. Vol. 93: Modern Technique and Technologies (MTT'2015). — United Kingdom, 2015.
 
Права Open access (info:eu-repo/semantics/openAccess)
 
Издатель IOP Publishing